Test Compression for Launch-on-Capture Transition Fault Testing
نویسندگان
چکیده
A new low-power test compression scheme, called Dcompress, is proposed for launch-on-capture (LOC) transition fault testing by using a seed encoding design testability architecture, and application procedure. The scheme generates seeds all tests selecting primitive polynomial that encodes of compact set. software-defined linear feedback shift register SLFSR, to make the method conform current flow test. Experimental results on benchmark circuits show data volume can be compressed up 6300X with well-compacted baseline set 11.8M gates more than 1.1M scan flip-flops.
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ژورنال
عنوان ژورنال: ACM Transactions on Design Automation of Electronic Systems
سال: 2023
ISSN: ['1084-4309', '1557-7309']
DOI: https://doi.org/10.1145/3597433